NewsMeasurement sensitivity of Semiconductor Material quality has now increased 100,000 times

Measurement sensitivity of Semiconductor Material quality has now increased 100,000 times

Modified: February 9, 2021

wasserman-microwave-resonator-2 — Fig. 1. Rendering of microwave resonator showing the microwave signal’s (blue) size change resulting from a light pulse (red) once the pulse hits the infrared pixel (micrograph image of pixel is shown in the inset). Credit: Cockrell School of Engineering, The University of Texas at Austin